The best
method to determine an atomic arrangement with a high accuracy and precision is
based on diffraction techniques using X-rays and neutrons. Today there is a
strong focus of nano-size materials for specific applications as energy storage
materials as they exhibit many interesting properties. The small size of these
makes it necessary to use structural characterization methods with high spatial
resolution such as high resolution electron microscopy and electron diffraction.
This has lead to a strong interest to develop these techniques for structural
characterization, so called electron crystallography.
1. SEM
2. TEM
3. XRD
4. SAXS(Small Angle X-ray Scattering)
1. SEM
2. TEM
3. XRD
4. SAXS(Small Angle X-ray Scattering)
